Foreign matter can become mixed with food products during the production process for a variety of reasons. The discovery and identification of foreign matter and ascertaining its source are essential for maintaining food safety. Shimadzu’s non-destructive testing and analytical technologies can be used to detect foreign matter that is not externally visible and analyze for the elemental or molecular components.

Analysis of Inorganic Foreign Matter (EDX)

An energy-dispersive X-ray fluorescence (EDXRF) spectrometer permits the easy and rapid identification of inorganic foreign matter adhering to, or mixed into, food products. Below is an example of the qualitative analysis of a metal fragment on chocolate.

Analysis of Organic Foreign Matter (FTIR)

The Fourier transform infrared (FTIR) spectrophotometer measures the organic foreign matter spectrum and compares it with library data to identify the foreign matter. The example below shows the analysis of contamination on a frozen pizza. Some of the foreign substance was scraped off the frozen pizza, and the infrared spectrum was measured using a transmission infrared microscope. The spectrum of this foreign object was similar to that of a fluororesin.

EDXIR-Analysis software is specially designed to perform an integrated analysis of data from FTIR and EDX. The library used for data analysis (containing 485 data as standard) is original to Shimadzu.

Energy Dispersive X-ray Fluorescence Spectrometer EDX-7000/8000/8100


  • Large Sample Chamber

Accepts samples of up W300 x D275 x H100 mm.

  • Easy Operation

Automates complex set-up operations. Even     novices can easily conduct accurate measurements.

IRTracer-100 FTIR Spectrophotometer


  • High Sensitivity

High S/N ratio above 60,000:1. Microscope permits analysis of foreign matter in the micron size range.

  • Foreign Matter Analysis Program as Standard

Powerful support for foreign matter analysis. Includes more than 300 spectra of recognized foreign matter.

  • Easy Maintenance

Automatic dryer protects the optical system. Eliminates superfluous maintenance.

Software for Integrated Analysis of EDX and FTIR Data (EDXIR-Analysis)

Source: ETA


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