X-ray Fluorescence Spectroscopy

Wavelength Dispersive X-Ray Fluorescence Spectrometer

Model: XRF-1800

Manufacturer: SHIMADZU

Lab Center and R&D
Other industries
World first 250µm Mapping for wavelength dispersive analysis
Qualitative/quantitative analysis using higher-order X-rays
Film thickness measurement and inorganic component analysis for high-polymer thin films with background FP method.
It enables to analyze content distribution and intensity distribution of non uniform sample
More accurate evaluation of higher-order X-rays makes higher
Local analysis
Ease of use
Optimal conditions can be created based on prepared conditions for sample forms like liquid, powder, solid, metal and oxides
High reliability.

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